Nano blue tungsten oxide’s testing equipment varies according to different testing methods, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, photoelectron spectroscopy and electron energy analyzer.
1. X-ray diffraction is using X-ray to study the inner microstructure of material. Its basic structure includes high stability X-ray source, sample and sample position orientation adjustment mechanism system, ray detector and diffraction pattern processing analysis system.
2. Scanning Electron Microscope (SEM) is mainly using secondary electron signal imaging to observe the surface morphology of sample, that is, using narrow electron beam to scan sample by electron beam interaction with sample. It is mainly about secondary electron emission.
3. Transmission Electron Microscope (TEM). Microstructure cannot be seen in the optical microscope is clear under TEM. These structures are called sub-microstructure or ultra-structure. To see these structures, a shorter wavelength light source is often chosen to improve the resolution of the microscope. At present, the resolution of TEM can reach 0.2nm.
4. The photoelectron spectrometer mainly consists of excitation source, sample ionization chamber, electronic energy analyzer, electronic detector, vacuum system and data processing system. The ultraviolet radiation source and X-ray source are commonly used.
5. Electron energy analyzer is used to measure the energy distribution emitted from the surface of sample. The photoelectron spectrum is a flow of electrons relative to the kinetic energy of map.
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